Measurement and data-assisted simulation of bit error rate in RQL circuits

A circuit-simulation-based method is used to determine the thermally-induced bit error rate of superconducting logic circuits. Simulations are evaluate multidimensional Gaussian integral across noise current sources attached active devices. The data-assisted and has predictive power. Measurement determines value a single parameter, effective bandwidth, for each mechanism. errors in distributed networks comparator-free RQL nucleate multiple Josephson junctions, so critical about three times that individual bandwidth only 6-23% junction plasma frequency at modest clock 3.4GHz, which 1% frequency. This analysis shows ways measured comes out much lower than simplistic estimates based on isolated